Return to original Test Digest book review. VLSI Test Principles and Architectures: Design for Testability, Laung-Terng Wang, Chen-Wen Wu, and Xiaoquing Wen (editors), Elsevier Science ...
The cost of testing complex system-on-chip designs will soon surpass the cost of manufacturing them. Clearly this is an unstable situation. It is simply too hard to keep up with Moore's Law. While the ...
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